TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951)(President & COO Izumi Oi) announces the development and release of a new scanning electron microscope (SEM), the JSM-IT510 series, in November 2021.

The exact birth of the scanning microscope principle is not clear, as the work of numerous scientists contributed to its inception. However, it is generally accepted that the first scanning microscope ...

In situ nanoindentation within the SEM enables direct correlation of microstructure and mechanical properties.

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The SU8600 is a specialized imaging SEM ...

Coatings are required to remove or diminish the electrical charges that promptly accumulate in a nonconducting material when examined by a high-energy electron beam. Material samples investigated at ...